Decomposition method for localization of faulty electronic subcircuits

  • А. А. Верлань
  • С. А. Положаенко
  • И. Х. Осман

Abstract

A method for the localization of faulty subschemes of electronic devices based on the principle of decomposition is proposed. It is shown that by a multi-level (hierarchical) virtual partitioning of the overall device scheme into separate functional fragments and testing them in a certain way organized, one can single out the faulty subsystem. The effectiveness of the method of localization in the diagnosis of electronic devices is investigated.

Published
2019-03-28
How to Cite
Верлань, А., Положаенко, С., & Осман, И. (2019). Decomposition method for localization of faulty electronic subcircuits. Electrotechnic and Computer Systems, (69(69), 72-76. Retrieved from http://eltecs.opu.ua/index.php/journal/article/view/2650
Section
Automated electromechanical systems

Most read articles by the same author(s)